Periodo de publicación recogido
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Smart SiC MOSFET accelerated lifetime testing
Nick Baker, Francesco Iannuzzo
Microelectronics reliability, ISSN 0026-2714, Nº. 88-90, 2018, págs. 43-47
Failure mechanism analysis of fuses subjected to manufacturing and operational thermal stresses
A.S. Bahman, S.M. Jensen, Francesco Iannuzzo
Microelectronics reliability, ISSN 0026-2714, Nº. 88-90, 2018, págs. 304-308
Simple and effective open switch fault diagnosis of single-phase PWM rectifier
Keting Hu, Zhigang Liu, Francesco Iannuzzo, Frede Blaabjerg
Microelectronics reliability, ISSN 0026-2714, Nº. 88-90, 2018, págs. 423-427
Reliability-oriented environmental thermal stress analysis of fuses in power electronics
A.S. Bahman, Francesco Iannuzzo, T. Holmgaard, R.Ø. Nielsen, Frede Blaabjerg
Microelectronics reliability, ISSN 0026-2714, Nº. 76-77, 2017, págs. 25-30
Haoze Luo, Wuhua Li, Xiangning He, Francesco Iannuzzo, Frede Blaabjerg
Microelectronics reliability, ISSN 0026-2714, Nº. 76-77, 2017, págs. 123-130
A survey of SiC power MOSFETs short-circuit robustness and failure mode analysis
L. Ceccarelli, P.D. Reigosa, Francesco Iannuzzo, Frede Blaabjerg
Microelectronics reliability, ISSN 0026-2714, Nº. 76-77, 2017, págs. 272-276
Wire bond degradation under thermo- and pure mechanical loading
Kristian B. Pedersen, Dennis A. Nielsen, B. Czerny, G. Khatibi, Francesco Iannuzzo, Vladimir N. Popok, Kjeld Pedersen
Microelectronics reliability, ISSN 0026-2714, Nº. 76-77, 2017, págs. 373-377
Die degradation effect on aging rate in accelerated cycling tests of SiC power MOSFET modules
Haoze Luo, Nick Baker, Francesco Iannuzzo, Frede Blaabjerg
Microelectronics reliability, ISSN 0026-2714, Nº. 76-77, 2017, págs. 415-419
Capacitive effects in IGBTs limiting their reliability under short circuit
P.D. Reigosa, Francesco Iannuzzo, Munaf Rahimo, Frede Blaabjerg
Microelectronics reliability, ISSN 0026-2714, Nº. 76-77, 2017, págs. 485-489
Advanced power cycler with intelligent monitoring strategy of IGBT module under test
U.M. Choi, Frede Blaabjerg, Francesco Iannuzzo
Microelectronics reliability, ISSN 0026-2714, Nº. 76-77, 2017, págs. 522-526
Reliability issues in power electronics
Francesco Iannuzzo, Mauro Ciappa
Microelectronics reliability, ISSN 0026-2714, Nº. 58, 2016, págs. 1-2
Modern IGBT gate driving methods for enhancing reliability of high-power converters — An overview
Haoze Luo, Francesco Iannuzzo, Paula Diaz Reigosa, Frede Blaabjerg, Wuhua Li, Xiangning He
Microelectronics reliability, ISSN 0026-2714, Nº. 58, 2016, págs. 141-150
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