págs. 1-1
Hardening silicon-on-insulator nMOSFETs by multiple-step Si+ implantation
Huixiang Huang, YanYang Huang, Jianchun Cheng, Sufen Wei, Kai Tang, Dawei Bi, Zhengxuan Zhang
págs. 1-9
An efficient temperature dependent hot carrier injection reliability simulation flow
Mehdi Kamal, Qing Xie, Massoud Pedram, Ali Afzali-Kusha, Saeed Safari
págs. 10-19
págs. 20-23
págs. 24-33
págs. 34-38
págs. 39-46
págs. 47-52
Impact of on- and off-chip protection on the transient-induced latch-up sensitivity of CMOS IC
Mirko Scholz, Shih-Hung Chen, Geert Hellings, Dimitri Linten
págs. 53-58
págs. 59-63
Temperature dependent Young's modulus and quality factor of CMOS-MEMS resonator: Modelling and experimental approach
Mohammad Tariq Jan, Farooq Ahmad, Nor Hisham B. Hamid, Mohd Haris B. Md Khir, Khalid Ashraf, Muhammad Shoaib
págs. 64-70
págs. 71-78
págs. 79-85
Experimental study of multilayer SiCN barrier film in 45/40 nm technological node and beyond
Zhou Ming, Xiao De Yuan, Peng Shi Min, Hong Zhong Shan, Shu Yi Xie
págs. 86-92
págs. 93-100
An embedded trace FCCSP substrate without glass cloth
Shin-Hua Chao, Chih-Ping Hung, Mark Chen, Youru Lee, Joey Huang, Golden Kao, Ding-Bang Luh
págs. 101-110
págs. 111-127
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