págs. 1-11
Mechanism of gate dielectric degradation by hydrogen migration from the cathode interface
Yusuke Higashi, Riichiro Takaishi, Koichi Kato, Masamichi Suzuki, Yasushi Nakasaki, Mitsuhiro Tomita, Yuichiro Mitani, Masuaki Matsumoto, Shohei Ogura, Katsuyuki Fukutani, Kikuo Yamabe
págs. 12-21
págs. 22-31
Erosion defect formation in Ni-gate AlGaN/GaN high electron mobility transistors
P.G. Whiting, M.R. Holzworth, A.G. Lind, S. J. Pearton, K.S. Jones, L. Liu, T.S. Kang, F. Ren, Y. Xin
págs. 32-40
págs. 41-48
Corrosion behavior of crystalline silicon solar cells
Huaping Xiong, Chuanhai Gan, Xiaobing Yang, Zhigang Hu, Haiyan Niu, Jianfeng Li, Jianfang Si, Pengfei Xing, Xuetao Luo
págs. 49-58
Interacting multiple model particle filter for prognostics of lithium-ion batteries
Xiaohong Su, Shuai Wang, Michael Pecht, Lingling Zhao, Zhe Ye
págs. 59-69
págs. 70-78
págs. 79-83
págs. 84-96
págs. 97-102
Peridynamic wetness approach for moisture concentration analysis in electronic packages
C. Diyaroglu, S. Oterkus, E. Oterkus, E. Madenci, S. Han, Y. Hwang
págs. 103-111
págs. 112-121
Book Review: Carbon Nanotubes for Interconnects: Process, Design and Applications (2017), Springer, ISBN: ISBN 978-3-319-29744-6 (Print) ISBN 978-3-319-29746-0 (Online)
págs. 122-123
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