Resumen de Academic network for microelectronic test education
F. Novak, A. Biasizzo, Y. Bertrand, M.-L. Flottes, Luz Balado, J. Figueras, S. Di Carlo, P. Prinetto, N. Pricopi, H-J. Wunderlich, J-P. van der Hayden
This paper is an overview of the activities performed in the framework of the European IST project EuNICE-Test (European Network for Initial and Continuing Education in VLSI/SOC Testing) using remote automatic test equipment (ATE)), addressing the shortage of skills in the microelectronics industry in the field of electronic testing. The project was based on the experience of the common test resource centre (CRTC) for French universities. In the framework of the EuNICE-Test project, the existing network expanded to 4 new academic centres: Universitat Polite Ácnica de Catalunya, Spain, Politecnico di Torino, Italy, University of Stuttgart, Germany and Jozef Stefan Institute Ljubljana, Slovenia. Assessments of the results achieved are presented as well as course topics and possible future extensions.
