Statistics in Pharmaceutical Development and Manufacturing
John J. Peterson, Ronald D. Snee, Paul R. McAllister
págs. 111-134
A Review of Statistical Methods for Quality Improvement and Control in Nanotechnology
Jye-Chyi Lu, Shuen-Lin Jeng, Kaibo Wang
págs. 148-164
Exact Calculation of Integrated Prediction Variance for Response Surface Designs on Cuboidal and Spherical Regions
Wayner R. Wesley, James R. Simpson, Peter A. Parker, Joseph J. Pignatiello Jr.
págs. 165-180
Product and Process Improvement Using Mixture-Process Variable Methods and Robust Optimization Techniques
Narinder Singh Sahni, Greg F. Piepel, Tormod Naes
págs. 181-197
Statistical Process Monitoring of Nonlinear Profiles Using Wavelets
Eric Chicken, Joseph J. Pignatiello Jr., James R. Simpson
págs. 198-212
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