A Review of Statistical Methods for Quality Improvement and Control in Nanotechnology

• Autores: Jye-Chyi Lu, Shuen-Lin Jeng, Kaibo Wang
• Localización: Journal of quality technology: A quarterly journal of methods applications and related topics, ISSN 0022-4065, Vol. 41, Nº. 2, 2009, págs. 148-164
• Idioma: inglés
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• Resumen

  • Nanotechnology has become a multidisciplinary subject that will affect every sector of the economy and daily life in the near future. Science-based technologies and the use of statistical methods have helped the advancement of nanotechnology. Some instances where statistical methods have been used in nanoscale applications are reviewed. Topics include experimental design, uncertainty modeling, process optimization and monitoring, and areas for future research.