Resumen de Mapping of internal distributions onto a lumped element network for CMOS latch-up simulation

C. Werner, J. Harter, D. Takacs, A.W. Wieder

• An efficient device simulation method is presented, which has been derived from mapping the results of a complete two‐dimensional (2‐D) analysis onto an equivalent lumped element network. The method is currently being used to predict latch‐up sensitivities of CMOS process design.