Assessing body built-in current sensors for detection of multiple transient faults

• Autores: R.A.C. Viera, J.-M. Dutertre, M.-L. Flottes, O. Potin, G. Di Natale, B. Rouzeyre, R. Possamai Bastos
• Localización: Microelectronics reliability, ISSN 0026-2714, Nº. 88-90, 2018, págs. 128-134
• Idioma: inglés
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• Resumen

  • Over the last few years, many architectures of body or bulk built-in current sensors (BBICSs) have been proposed to detect transient faults (TFs) in integrated circuits, all of them assessed through simulations in which only single TFs affect the circuit under run-time test. This work assesses and demonstrates the ability of a BBICS architecture in also detecting multiple and simultaneous TFs. Based on the classical double-exponential transient current model, multiple fault effects on a case-study circuit have been simulated with the injection of several current sources approximately representing the Gaussian distribution of a laser beam attack. Results show the BBICS architecture is able to detect multiple TFs simultaneously perturbing sensitive nodes of the case-study circuit.