Prediction of LIN communication robustness against EFT events using dedicated failure models

• Autores: F. Escudié, F. Caignet, N. Nolhier, Marise Bafleur
• Localización: Microelectronics reliability, ISSN 0026-2714, Nº. 76-77, 2017, págs. 685-691
• Idioma: inglés
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• Resumen

  • Abstract During its life, an automotive application can encounter several perturbations such as fast transient of ESD discharges. In this paper, we propose a LIN transceiver behavior model to predict both hard and soft failures within a communication link. The proposed model, extracted from measurements, is implemented into simulation as a failure block. We will show that depending on the output state of the LIN, the data reading behavior could be different. Using such model, corrections at system level can be implemented to avoid failures.