Resumen de XPS, DRUV-VIS and ESR characterization of the non-stoichiometric compound Ge_(0.74) V_(0.21) □_(0.05) O_(2)
J. L. Boldú, J. Barreto, I. Rosales, L. Bucio, E. Orozco
Microcrystalline powders of the nonstoichiometric Ge_(0.74) V_(0.21) □_(0.05) O_(2)compound were prepared by conventional high temperature solidstate reactions. The powders were characterized by X-ray diffraction (XRD); scanning electron microscopy (SEM); X-ray photoelectron spectroscopy (XPS); diffuse reflectance ultraviolet-visible spectroscopy (DRUV-VIS) and electron spin resonance (ESR) spectroscopy. From the analysis performed on compound, it was found that: The powders showed a rutile type crystalline structure with a rectangular prismatic crystalline habit. The XPS analysis, confirm the presence of V^(4+) and V^(5+) vanadium ions, the DRUV-VIS spectra show absorption bands in the 200-800 nm wave length interval and the ESR analysis confirms that the V^(4+) ions are within microcrystals, hosted as VO^(2+) at sites of rhombic (C_(2v)) symmetry.
