XPS, DRUV-VIS and ESR characterization of the non-stoichiometric compound Ge_(0.74) V_(0.21) □_(0.05) O_(2)

• J.L. Boldú ^[1] ; J. Barreto ^[1] ; I. Rosales ^[1] ; L. Bucio ^[1] ; E.Orozco ^[1]
  1. [1] Universidad Nacional Autónoma de México

     Universidad Nacional Autónoma de México

     México

     
• Localización: Revista Mexicana de Física, ISSN-e 0035-001X, Vol. 63, Nº. 2, 2017, págs. 166-170
• Idioma: inglés
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• Resumen

  • Microcrystalline powders of the nonstoichiometric Ge_(0.74) V_(0.21) □_(0.05) O_(2)compound were prepared by conventional high temperature solidstate reactions. The powders were characterized by X-ray diffraction (XRD); scanning electron microscopy (SEM); X-ray photoelectron spectroscopy (XPS); diffuse reflectance ultraviolet-visible spectroscopy (DRUV-VIS) and electron spin resonance (ESR) spectroscopy. From the analysis performed on compound, it was found that: The powders showed a rutile type crystalline structure with a rectangular prismatic crystalline habit. The XPS analysis, confirm the presence of V^(4+) and V^(5+) vanadium ions, the DRUV-VIS spectra show absorption bands in the 200-800 nm wave length interval and the ESR analysis confirms that the V^(4+) ions are within microcrystals, hosted as VO^(2+) at sites of rhombic (C_(2v)) symmetry.