Quality control and applied statistics

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  Año 1994, Vol. 39, Número 1

  • Statistical process control

    • Statistical process control at Motorola's Austin assembly plant

      Sanjay Kumar, Yash P. Gupta

      págs. 19-20

      

  • Sampling principles and plans

    • Adaptative sampling enhancements for Shewhart control charts

      George C. Runger, Douglas C. Montgomery

      págs. 21-22

      

    • An improved Bayesian procedure for calculating sample sizes in miltinomial sampling

      C.J. Adcock

      págs. 23-24

      

    • Sample size determination for p charts

      Douglas G. Bonett

      págs. 25-27

      

  • Quality Management

    • Total quality management in the public sector

      Bill DeLaney

      págs. 29-30

      

    • Total quality management: A state-of-the-art survey of European 'industry'?

      Ton van der Wiele, J. Timmers, B Bertsch, A.R.T. Williams, B. G. Dale

      págs. 31-32

      

    • Diagnosing total quality management Part 2

      B. A. G. Bossink, J. F. B. Gieskes, T.N.M Pas

      págs. 33-34

      

    • Total quality management - The critical sucess factors

      Leslie J. Porter, Adrian J. Parker

      págs. 35-36

      

    • The light before the dawn: The origin of quality Japanese products during the 1920s

      Peter B. Petersen

      págs. 37-38

      

    • Sheffield Hallam University and European master in total quality management

      Gopal K. Kanji

      págs. 39-39

      

    • On-line group process support

      A.E Gear, M.J. Read

      págs. 41-43

      

    • Managing change with configuration-value management

      Craig A. Stevens and Steve Gambrell

      págs. 45-48

      

    • Organizational culture and strategic management: Issues in the management of strategic change

      Clayton G. Smith, Robert P. Vecchio

      págs. 49-51

      

    • Organizational culture and performance: Proposing and testing a model

      George A. Marcoulides, Ronald H. Heck

      págs. 53-55

      

    • What prevents TQM implementation in helath care organizations?

      Carol A. Reeves, David A. Bednar

      págs. 57-59

      

    • The antecedents and consequences of customer satisfaction for firms

      Eugene W. Anderson, Mary Wolfinbarger

      págs. 61-64

      

  • Experimentation and correlation

    • Comparing two groups of ranked objects by pairwise matching

      Jingyuan Liu, H.A. David

      págs. 65-66

      

    • A simple analysis of unreplicated factorials with possible abnormalities

      Victor M. Aguirre Torres

      págs. 67-68

      

  • Applications

    • Incentive and quality assurance: An agency theoretical perspective

      Yeong Ling Yang

      págs. 69-71

      

    • A synthesis of decision models for tool management in automated manufacturing

      Ann E. Gray, Abraham Seidmann, Kathryn E Stecke

      págs. 73-76

      

    • Manufacturing flexibility: A strategic perspective

      Donald Gerwin

      págs. 77-80

      

    • Concurrent engineering in an expert system

      Deborah L. Thurston

      págs. 81-82

      

    • Death of the lethargie: Effects of expansion into new technical subfields on performance in a firm's base business

      Will Mitchell, Kulwant Singh

      págs. 83-85

      

  • Analytical process control

    • Operational performance of airlines: An extension of traditional measurement paradigms

      Michael Schefczyk

      págs. 87-89

      

    • Application of artificial neural networks in process fault diagnosis

      Timo Sorsa, Heikki Nuorteva

      págs. 91-92

      

    • The impact of Computerized performance monitoring design features on the performance appraisal process

      Carol T. Kulik, Maureen L. Ambrose

      págs. 93-95

      

    • Total Systems intervention: A practitioner's critique

      S.M. Green

      págs. 97-98

      

  • Reliability

    • A quality process approach to electronic systems reliability

      Paul B. Hugge

      págs. 99-100

      

    • VLSI reliability challenges: From device physics to wafer scale systems

      Eiji Takeda, Kunihiko Ikuzaki, Hisao Kato, Yuzuru Ohji, Kenji Hinode, Akemi Hamada, Toshiyuki Sakuta, Takahiro Funabiki, Toshio Sasaki

      págs. 101-103