Limitation of switching-self-clamping-mode “SSCM” in high voltage IGBTs
Cailin Wang, Wuhua Yang, Jing Yang, Lei Zhang, Ruliang Zhang
págs. 1-6
págs. 7-20
págs. 21-28
págs. 29-36
Improvement of the tolerated raw bit error rate in NAND flash-based SSDs with selective refresh
Emna Farjallah, Jean-Marc Armani, Valentin Gherman, Luigi Dilillo
págs. 37-45
págs. 46-50
págs. 51-59
págs. 60-70
Effect of pulse-reverse plating on copper: Thermal mechanical properties and microstructure relationship
Bau-Chin Huang, Cheng-Hsien Yang, Cheng-Yu Lee, Yu-Lung Hu, Chi-Chang Hsu, Cheng-En Ho
págs. 71-77
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