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Study of Organic Semiconductors for Device Applications

  • Autores: Marco Stella
  • Directores de la Tesis: Joaquim Puigdollers González (dir. tes.), Jordi Andreu Batalle (dir. tes.)
  • Lectura: En la Universitat de Barcelona ( España ) en 2010
  • Idioma: inglés
  • Tribunal Calificador de la Tesis: Rene Albert Johan Janssen (presid.), Marta Fonrodona Turon (secret.), Germà García Belmonte (voc.)
  • Materias:
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  • Resumen
    • Organic semiconductors are being investigated as an alternative to more traditional materials such as silicon, for the fabrication of different types of electronic devices. The advantages of such materials are flexibility, lightness and quick and low cost device production methods. In this thesis we analyze some small molecule organic semiconductors for their use in devices such as thin film transistors and photovoltaic cells. These materials, deposited in thin films on glass by thermal vacuum evaporation, are copper phthalocyanine (CuPc) and pentacene, p-type materials, fullerene (C60), PTCDA and PTCDI-C13, that are n-type. We analyze their optical properties by optical transmittance measurement and photothermal deflection spectroscopy (PDS). By such means we obtain the absorption coefficient of the materials in sub-gap region (near infrared - NIR), directly related with the density of electronic states. Furthermore, we examine thin film microstructure by X-ray diffraction (XRD) in order to observe if it is amorphous or polycrystalline. The data obtained by optical methods are used to calculate optical gap (Eg) and Urbach energy (Eu). The former of these parameters gives important information about the absorption properties of the material in the visible and NIR ranges of the spectrum, while the latter about the structural disorder in the film. Since a clear model for organic semiconductors is still not defined, in both cases we employ models that are usually considered in the case of inorganic semiconductors. The XRD analysis indicates that, in the deposition conditions used in this work, only C60 grows with amorphous structure while all the other materials are polycrystalline. Such result is used to determine which law can be used to estimate the optical gap: the general law for direct allowed electronic transitions in semiconductors for polycrystalline materials or the Tauc law for amorphous ones. The Urbach law, usually employed to have an idea about the amount of disorder in amorphous films, is used for all our materials as an indicator of thin film quality. Furthermore, we examine the stability of the materials over time under exposure to direct radiation and atmosphere and to compare the results with the ones obtained for samples simply exposed to atmosphere. PTCDA and CuPc have demonstrated to be stable against oxidizing agents that are present in atmosphere while the other materials suffer modifications in their optical properties. Such variations, principally located in the sub-gap region of the absorption region, indicate that an increase in the absorption level is obtained, probably due to the presence of defects that could work as charge carrier traps. Annealing treatments are performed on the degraded materials to observe that the degradation process is not reversible. Organic photovoltaic cells always include a heterojunction between two semiconductors, so the same study is performed on mixtures of two materials, a p-type and an n-type one, testing all the possible combinations between the investigated materials. The films are obtained by co-evaporating the two materials in 1:1 proportion. A mixture containing a degrading material also degrades. Heat treatments performed on the samples yield a partial crystallization of some materials but not of others and fail to recover the original optical properties when degradation occurs. Finally, two types of devices are fabricated: thin film transistors (TFTs) using PTCDI-C13 and diodes with CuPc. In the first case we obtain very interesting results, determining that the devices work as typical n-type channel transistors. An analysis of the device characterizations allows us to determine the density of electronic states in the channel obtaining a result that is very similar to the one obtained by optical means on the same material. In the second case we observe the typical diode behaviour but the response with light of such devices, characterized by having a structure similar to the one of Schottky type solar cells, is very low.


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