Ultrasensitive Magneto-Optical Ellipsometry for depth-resolved Magnetometry
- Autores: Carmen Martín Valderrama
- Directores de la Tesis: Ane Martinez de Guereñu Elorza (dir. tes.), Andreas Berger (codir. tes.), Jose María Pitarque de la Torre (tut. tes.)
- Lectura: En la Universidad del País Vasco - Euskal Herriko Unibertsitatea ( España ) en 2025
- Idioma: español
- Programa de doctorado: Programa de Doctorado en Física de Nanoestructuras y Materiales Avanzados/Physics of Nanostructures and Advanced Materials por la Universidad del País Vasco/Euskal Herriko Unibertsitatea
- Enlaces
- Tesis en acceso abierto en: ADDI
- Resumen
This thesis develops and validates a comprehensive experimental methodology for detecting and characterizing depth-dependent vector magnetization states in nanoscale multilayers, addressing a longstanding challenge in magnetism and spintronics where non-collinear spin structures are central yet rarely measured directly. The work establishes a solid methodological base by experimentally verifying the linear magneto-optical reflection matrix and demonstrating a linear superposition approach for multilayer magneto-optical signals. Building on this, the generalized magneto-optical ellipsometry method enabled the unambiguous identification of non-collinear magnetization profiles and the achievement of full, layer-resolved vector magnetometry for multilayers with two ferromagnetic thin films, revealing field-dependent magnetization rotations and uncovering anomalous out-of-plane signals attributable to interlayer Dzyaloshinskii Moriya interactions. These advances were made possible through the careful design and fabrication of high-quality multilayers and supported by macrospin simulations that reproduced the observed behaviors. Altogether, the thesis provides a robust framework for layer-resolved vector magnetometry and contributes new insights into the complex physics governing magnetic multilayers.
