Periodo de publicación recogido
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Bridge Designs for Modeling Systems With Low Noise.
Bradley Jones, Rachel T. Silvestrini, Douglas C. Montgomery, David M. Steinberg
Technometrics: A journal of statistics for the physical, chemical and engineering sciences, ISSN 0040-1706, Vol. 57, Nº. 2, 2015, págs. 155-163
Comment: Doit-Some Thoughts on How to Do It.
David M. Steinberg, Bradley Jones
Technometrics: A journal of statistics for the physical, chemical and engineering sciences, ISSN 0040-1706, Vol. 54, Nº. 3, 2012, págs. 236-238
Response surface methodology in biotechnology
David M. Steinberg, Dizza Bursztyn
Quality control and applied statistics, ISSN 0033-5207, Vol. 56, Nº. 1-2, 2011, págs. 109-110
Technometrics highlights: profile monitoring highlighted in August issue
David M. Steinberg
AMSTAT news: the membership magazine of the American Statistical Association, ISSN 0163-9617, Nº. 398, 2010, págs. 18-19
May issue features advances in reliability
David M. Steinberg
AMSTAT news: the membership magazine of the American Statistical Association, ISSN 0163-9617, Nº. 395, 2010, págs. 23-25
Special issue features anomaly detection
David M. Steinberg
AMSTAT news: the membership magazine of the American Statistical Association, ISSN 0163-9617, Nº. 392, 2010, págs. 15-17
Special issue focuse on computer modeling
David M. Steinberg
AMSTAT news: the membership magazine of the American Statistical Association, ISSN 0163-9617, Nº. 391, 2010, págs. 35-37
David M. Steinberg
Technometrics: A journal of statistics for the physical, chemical and engineering sciences, ISSN 0040-1706, Vol. 52, Nº. 4, 2010, págs. 376-378
Mini-Issue on anomaly Detection.
David M. Steinberg
Technometrics: A journal of statistics for the physical, chemical and engineering sciences, ISSN 0040-1706, Vol. 52, Nº. 1, 2010, pág. 5
Special Issue on Compoter Modeling.
María Jesús Bayarri García, Jim Berger, David M. Steinberg
Technometrics: A journal of statistics for the physical, chemical and engineering sciences, ISSN 0040-1706, Vol. 51, Nº. 4, 2009, pág. 353
Editor's Note: Improved Web Site With Supplemental Materials.
David M. Steinberg
Technometrics: A journal of statistics for the physical, chemical and engineering sciences, ISSN 0040-1706, Vol. 51, Nº. 2, 2009, pág. 109
The future of Industrial Statistics. A Panel Discussion.
David M. Steinberg, Soren Bisgaard, Necip Doganaksoy, Nicholas I. Fisher, Bert Gunter, Gerald Hahn, Sallie Keller-McNulty, Jon Kettenring, William Q. Meeker, Douglas C. Montgomery, C.F. Jeff Wu
Technometrics: A journal of statistics for the physical, chemical and engineering sciences, ISSN 0040-1706, Vol. 50, Nº. 2, 2008, págs. 103-127
David M. Steinberg
Technometrics: A journal of statistics for the physical, chemical and engineering sciences, ISSN 0040-1706, Vol. 50, Nº. 1, 2008, pág. 1
Technometrics: How It All Started.
David M. Steinberg, Soren Bisgaard
Technometrics: A journal of statistics for the physical, chemical and engineering sciences, ISSN 0040-1706, Vol. 50, Nº. 1, 2008, págs. 2-7
New frontiers in the design of experiments
Ron S. Kenett, David M. Steinberg
Quality control and applied statistics, ISSN 0033-5207, Vol. 52, Nº. 1, 2007, págs. 79-82
Tragic News About Randy Sitter.
David M. Steinberg
Technometrics: A journal of statistics for the physical, chemical and engineering sciences, ISSN 0040-1706, Vol. 49, Nº. 4, 2007, pág. 369
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