High-pass negative group delay analysis of single capacitor three-port circuit

• Nour Mohammad Murad ^[1] ; Antonio Jaomiary ^[3] ; Samar Yazdani ^[4] ; Fayrouz Haddad ^[5] ; Mathieu Guerin ^[5] ; George Chan ^[6] ; Wenceslas Rahajandraibe ^[5] ; Sahbi Baccar ^[2]
  1. [1] University of La Réunion

     University of La Réunion

     Arrondissement de Saint-Denis, Reunión

     
  2. [2] University of Rouen

     University of Rouen

     Arrondissement de Rouen, Francia

     
  3. [3] Ecole Normale Superieure pour l’Enseignement Technique (ENSET), University of Antsiranana, Antsiranana, Madagascar
  4. [4] Software Engineering Department, Bahria University Karachi Campus, Karachi, Pakistan
  5. [5] IM2NP – UMR 7334, Aix-Marseille-University, Aix en Provence, France
  6. [6] ASMPT Hong Kong Ltd., Tsing Yi, Hong Kong

  Mostrar afiliaciones +
• Localización: Compel: International journal for computation and mathematics in electrical and electronic engineering, ISSN 0332-1649, Vol. 42, Nº 6, 2023, págs. 1311-1334
• Idioma: inglés
• Enlaces
  • Texto completo
• Resumen

  • Purpose This paper aims to develop high-pass (HP) negative group delay (NGD) investigation based on three-port lumped circuit. The main particularity of the proposed three-port passive topology is the consideration of only a single circuit element represented by a capacitor.

    Design/methodology/approach The methodology of the paper is to consider the S-matrix equivalent model derived from admittance matrix approach. So, an S-matrix equivalent model of a three-port circuit topology is established from admittance matrix approach. The frequency-dependent basic expressions are explored to perform the HP-NGD analysis. Then, the existence condition of HP-NGD function type is analytically demonstrated. The specific characteristics and synthesis equations of HP-NGD circuit with respect to the desired optimal NGD value are established.

    Findings After computing the frequency expressions to perform the HP-NGD analysis, this study demonstrated the existence condition of HP-NGD function type analytically. The validity of the HP-NGD theory is verified by a prototype of three-port circuit. The proof-of-concept (POC) single capacitor three-port circuit presents an NGD response and characteristics from analytical calculation and simulation is in very good correlation.

    Originality/value An innovative theory of HP-NGD three-port circuit is studied. The proposed HP-NGD topology is constituted by only a single capacitor. After the topological description, the S-matrix model is established from the Y-matrix by means of Kirchhoff voltage law and Kirchhoff current law equations. A POC of single capacitor three-port circuit was designed and simulated with a commercial tool. Then, a prototype with a surface-mounted device component was fabricated and tested. As expected, simulation and measurement results in very good agreement with the calculated model show the feasibility of the HP-NGD behavior. This work is compared to other NGD-type function with diverse number of ports and components.