Critical evaluation of scattering models within the full band Monte Carlo simulation framework

• M. Hjelm ^[1] ; H.-E Nilsson ^[1] ; A. Martinez ^[2]
  1. [1] Department of Information Technology and Media, Mid-Sweden University
  2. [2] Department of Microelectronics and Information Technology, KTH (Royal Institute of Technology)
• Localización: Recent Advances in Multidisciplinary Applied Physics: Proceedings of the First International Meeting on Applied Physics (APHYS-2003) October 13-18th 2003, Badajoz, Spain / A. Méndez Vilas (dir.), Formatex Research Center (dir.), 2005, ISBN 978-0-08-044648-6, págs. 319-323
• Idioma: español
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