Roughness measurement by speckle correlation interferometer with a phase shifting by geometrical phase control

• Daniel Gallego ^[1] ; Oscar López ^[1] ; M.C. Nistal ^[1] ; Vicente Moreno ^[1]
  1. [1] Universidade de Santiago de Compostela

     Universidade de Santiago de Compostela

     Santiago de Compostela, España

     
• Localización: Recent Advances in Multidisciplinary Applied Physics: Proceedings of the First International Meeting on Applied Physics (APHYS-2003) October 13-18th 2003, Badajoz, Spain / A. Méndez Vilas (dir.), Formatex Research Center (dir.), 2005, ISBN 978-0-08-044648-6, págs. 343-349
• Idioma: español
• Texto completo no disponible (Saber más ...)