Low-cost system for full-wafer photoluminescence characterization of photovoltaic silicon

• B. Moralejo ^[1] ; A. Tejero ^[1] ; O. Martínez ^[1] ; M. A. González ^[1] ; J. Jiménez ^[1] ; V. Parra ^[2]
  1. [1] Universidad de Valladolid

     Universidad de Valladolid

     Valladolid, España

     
  2. [2] DC Wafers Investments
• Localización: Proceedings of the 2013 Spanish Conference on Electron Devices / Héctor García (aut.), Helena Castán Lanaspa (aut.), 2013, ISBN 9781467346665
• Idioma: inglés
• Texto completo no disponible (Saber más ...)
• Resumen

  • Photoluminescence imaging technique has recently emerged as a powerful tool for obtaining very quick sorting of silicon based solar wafers and cells. In this work, we report on a low-cost photoluminescence imaging system, paying special attention to the different constituting elements. Results on both commercial multicrystalline (mc) and seed-monocast (sm) Si wafers and solar cells are discussed.