Degradation of AlInAs/InGaAs/InP quantum cascade lasers due to electrode adhesion failure

• Autores: D. Pierścińska, K. Pierściński, G. Sobczak, P. Gutowski, M. Płuska, M. Bugajski
• Localización: Microelectronics reliability, ISSN 0026-2714, Nº. 99, 2019, págs. 113-118
• Idioma: inglés
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• Resumen

  • In this paper external degradation type of failure of Quantum Cascade Laser is analyzed. The failure mode discussed in the work is connected with the damage of the gold, top electrode. We show how fabrication faults translate to degradation of device and monitor temperature distributions as well as electrical characteristics of the device during the process. The aim of this research is to demonstrate how external degradation process develops in case of AlInAs/InGaAs/InP quantum cascade lasers.