Physical Model of the Interference Immunity of Electronic Devices and Conclusions Concerning their Testing and Operating Characteristics

• Autores: G. Hentschel, H. Bauer
• Localización: ETEP: European transactions on electrical power engineering, ISSN 1430-144X, Vol. 10, Nº 3, 2000, págs. 147-154
• Idioma: alemán
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