A model for transient impact ionisation

• D.C. Herbert ^[1]
  1. [1] DRA Electronics Division, RSRE, Reino Unido
• Localización: Compel: International journal for computation and mathematics in electrical and electronic engineering, ISSN 0332-1649, Vol. 11, Nº 4, 1992, págs. 413-418
• Idioma: inglés
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• Resumen

  • A model for impact ionisation allowing for the spatial transient is described. Ionisation rates and phonon scattering rates are adjusted to fit experimental data. To reduce some of the uncertainty, the calculated ionisation rates due to Kane are used.