Resumen de Inverse modelling of amorphous silicon solar cell time-of-flight transients
A.A. Buykx, H.M. Wentinck, W. Crans, J.W. Metselaar
For the extraction of transport parameters from Time‐of‐Flight (TOF) measurements a simulation and optimization program was developed that uses the principle of Inverse Modelling. The model describing the physical transport processes in an amorphous device is discussed as well as the implementation of the simulator in the dataprocessor and optimization driver PROFILE. As an example a simulation of TOF measurements at an amorphous p‐i‐n solar cell is shown.
