Resumen de Transistor open-circuit fault diagnosis in two-level three-phase inverter based on similarity measurement
Cuicui Hang, Liming Ying, Naiqiu Shu
Two-level three-phase inverters are widely applied to industrial automation, utility systems, transportation and aerospace as motor drives and energy conversion for their high efficiency and outstanding control performance. Their reliability such as open-circuit fault had attracted considerable attention in the past decades because of performance reduce and high maintenance cost, however, no universal theory and methods had been proposed. Considering that the topology is extremely symmetrical and it is composed of the same semiconductor devices, such as semiconductor or diodes. In healthy condition with no open-circuit transistor in the topology, the topology is symmetric and three phase currents are similar, in faulty condition, the symmetry is broken and three phase currents are not similar again, similarity measurement algorithm based on residuals of current ordered-sequence Mannharden distance are proposed to detect and locate the open-circuit faults. Experimental results show high efficiency and merit of the proposed fault diagnosis method.
