A fast and robust approach to phase shift registration from randomly phase shifted interferograms

• Autores: Alexander Hildebrand, Claas Falldorf, Christoph von Kopylow, Ralf B. Bergmann
• Localización: SPECKLE 2012: V International Conference on Speckle Metrology : 10-12 september 2012 : Vigo, Spain / Ángel Manuel Fernández Doval (ed. lit.), María Cristina Trillo Yáñez (ed. lit.), José Carlos López Vázquez (ed. lit.), 2012, ISBN 9780819490902
• Idioma: inglés
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• Resumen

  • We present a fast and robust approach to phase shift registration from randomly phase shifted interferograms. The approach is based on a singular value decomposition followed by an iterative, projection based optimization procedure. Compared to known algorithms it is fast and shows comparable or better registration quality depending on the case of application