Miniaturization as a key factor to the development and application of advanced metrology systems
- Autores: Cosme Furlong, Ivo Dobrev, Ellery Harrington, Peter Hefti, Morteza Khaleghi
- Localización: SPECKLE 2012: V International Conference on Speckle Metrology : 10-12 september 2012 : Vigo, Spain / Ángel Manuel Fernández Doval (ed. lit.), María Cristina Trillo Yáñez (ed. lit.), José Carlos López Vázquez (ed. lit.), 2012, ISBN 9780819490902
- Idioma: inglés
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Resumen
Recent technological advances of miniaturization engineering are enabling the realization of components and systems with unprecedented capabilities. Such capabilities, which are significantly beneficial to scientific and engineering applications, are impacting the development and the application of optical metrology systems for investigations under complex boundary, loading, and operating conditions. In this paper, and overview of metrology systems that we are developing is presented. Systems are being developed and applied to high-speed and high-resolution measurements of shape and deformations under actual operating conditions for such applications as sustainability, health, medical diagnosis, security, and urban infrastructure. Systems take advantage of recent developments in light sources and modulators, detectors, microelectromechanical (MEMS) sensors and actuators, kinematic positioners, rapid prototyping fabrication technologies, as well as software engineering
