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Detection of surface defects by means of dynamic speckles

  • Autores: Ervin Nippolainen, Igor Sidorov, Alexei A. Kamshilin
  • Localización: SPECKLE 2012: V International Conference on Speckle Metrology : 10-12 september 2012 : Vigo, Spain / Ángel Manuel Fernández Doval (ed. lit.), María Cristina Trillo Yáñez (ed. lit.), José Carlos López Vázquez (ed. lit.), 2012, ISBN 9780819490902
  • Idioma: inglés
  • Texto completo no disponible (Saber más ...)
  • Resumen
    • In this paper we propose novel method possessing high fidelity and versatility for surface defect detection based on the spatially filtered dynamic speckles. It is shown that resolution of proposed method depends on the geometrical parameters of the optical system. The feasibility of the novel method for surface defect detection is demonstrated by experimental results which are in good agreement with theoretical estimations


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