XPowder has been developed in MS-XP Windows™ operative system in order to facilitate the mineral qualitative analysis by means of powder X-ray diffractograms, from ICDD PDF2. DAT database. Moreover, entirely automated and effective algorithm for quantitabve least square analysis (crystalline and amorphous materials) using the full pattern profile is implemented. Complementary analysis can be made: Automated unit-cell refinement, space group systematic hkl extinctions, automatic and efficient background subtraction and Ka2 stripping, polynomial spline data interpolation for enhancing the quality of the diffractograms, Fourier and functional filtering for poor crystallinity diffractograms, etc .. Profile line analysis that ineludes peak area calculation, FWHM, integrated width, asymmetry, areal asyrnmetry, form factor and calculation of average size (X-Size) with instrumental correction. Graphic capability ineludes recording in BMP image files, export to high quality images HPGL files, copies to the elipboard and impression of up to fifty diagrams simultaneously.
The PLUS version also allows to collect the diagrams directly from PWl710/00 diffractometers through a serial port (single diffractograms, in sequences, static and integration modes, etc) .
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