An anomaly detection system based on variable N-gram features and one-class SVM

• Wael Khreich ^[1] ; Babak Khosravifar ^[1] ; Abdelwahab Hamou-Lhadj ^[1] ; Chamseddine Talhi ^[2]
  1. [1] Concordia University

     Concordia University

     Canadá

     
  2. [2] École de Technologie Supérieure

     École de Technologie Supérieure

     Canadá

     
• Localización: Information and software technology, ISSN 0950-5849, Nº 91, 2017, págs. 186-197
• Idioma: inglés
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