A calculation method to estimate single event upset cross section

• Autores: F. Wrobel, A.D. Touboul, V. Pouget, L. Dilillo, J. Boch, F. Saigné
• Localización: Microelectronics reliability, ISSN 0026-2714, Nº. 76-77, 2017, págs. 644-649
• Idioma: inglés
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• Resumen

  • Abstract We calculate single event effect cross-section with a new general method based on the evaluation of the current collected by an electrode and the ability of the cell to dissipate the charge involved in the event. Basically, a part of the charge deposited by an ionizing particle is collected, and a part of this latest is dissipated during the transient. The approach allows explaining experimental cross section obtained for heavy ions irradiations. Moreover, the use of heavy ions experimental results allow predicting the single event crosses section for protons.