Failure analysis of projected capacitance touch panel liquid crystal displays – Two case studies

• Autores: Jia Lu, Zhennian Cao, Chuangjun Huang, Kunhui Xiao, Alan Street, Yufeng Dai
• Localización: Microelectronics reliability, ISSN 0026-2714, Nº. 76-77, 2017, págs. 571-574
• Idioma: inglés
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• Resumen

  • Abstract Projected capacitance touch panels are the dominant display/input technology today in smartphones and tablets. The rapid development of these technologies has introduced new and unexpected failure mechanisms, which has driven the development of new sample preparation methods and new applications of analytical techniques for failure analysis. This paper presents some of these mechanisms and methods in two case studies.