Enabling robust automotive electronic components in advanced CMOS nodes

• Autores: V. Huard, S. Mhira, F. Cacho, A. Bravaix
• Localización: Microelectronics reliability, ISSN 0026-2714, Nº. 76-77, 2017, págs. 13-24
• Idioma: inglés
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• Resumen

  • Abstract In this work, we have demonstrated that many elements are needed on top of conventional foundry reliability knowledge to enable robust automotive products in compliance with all restrictive norms. For intrinsic reliability, both reliability models (a design compatible WLR description), and dynamic aging compensation schemes are required. For extrinsic failures, screening procedures require well documented usage and are shown in use for volume production to bring the failure rate level down below 1 ppm automotive target. Altogether, the global approach developed in STMicroelectronics enable robust automotive products based on controlled and validated procedures.