Design and development of wiring harness test based on S3C44B0

• Shu-yan Jiang ^[1] ; Gang Luo ^[2] ; Yu-hua Cheng ^[1]
  1. [1] University of Electronic Science and Technology of
  2. [2] Chengdu Electromechanical College
• Localización: Compel: International journal for computation and mathematics in electrical and electronic engineering, ISSN 0332-1649, Vol. 29, Nº 2 (Special Issue: Selected papers from CAC 2008), 2010, págs. 362-369
• Idioma: inglés
• Enlaces
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• Resumen

  • Purpose – The purpose of this paper is to introduce a design method of an embedded advanced RISC machines (ARM) hardware circuit using the microprocessor S3C44B0 as a core according to a testing principle of wiring harness.

    Design/methodology/approach – The microprocessor module is designed with the S3C44B0 of Samsung Corp. The microprocessor send test instructions to the wiring harness circuit, receive and store the test data, get and display the test results by the liquid crystal display, and the wiring harness testing circuit is implemented by complex programmable logic device. The uClinux operating system is transplanted into the ARM hardware platform, and the developing and loading code of the uClinux device driver and a basic flow chart is given.

    Findings – The combination of S3C44B0 and uClinux embedded microprocessors achieved a powerful wiring harness tester driver development. This structure leads to a flexible configuration and convenient extension.

    Research limitations/implications – A Linux development environment is established and the device drivers compiled into the kernel. But the development of the application program and the user operating interface of the wiring harness have not been completed yet.

    Practical implications – After the development of the application program and the user operating interface of the wiring harness, this device should be able to find practical application in the industry.

    Originality/value – This wiring harness tester can detect different failures at the first time through the wiring harness on‐test to ensure the product quality, reduce the labor intensity, improve the working efficiency, and enhance the test accurately.