Extraction of circuit parameters from PCB by FDTD and SIBC

• Karl Hollaus ^[1] ; Oszkär Bíró ^[2] ; Gernot Matzenauer ^[2] ; Bernhard Weiß ^[2] ; Peter Caldera ^[3]
  1. [1] Rheinisch-Westfälische Technische Hochschule Aachen University

     Rheinisch-Westfälische Technische Hochschule Aachen University

     Städteregion Aachen, Alemania

     
  2. [2] Graz University of Technology

     Graz University of Technology

     Graz, Austria

     
  3. [3] Microelectronic Design Center

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• Localización: Compel: International journal for computation and mathematics in electrical and electronic engineering, ISSN 0332-1649, Vol. 28, Nº 4 (Special Issue: Selected papers from 13th IGTE Symposium), 2009, págs. 1091-1101
• Idioma: inglés
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• Resumen

  • Purpose – The purpose of this paper is to study the extraction of scattering parameters (SPs) from simple structures on a printed circuit board (PCB) by the finite difference time domain (FDTD) method with the aid of a surface impedance boundary condition (SIBC).

    Design/methodology/approach – The incorporation of SIBC into the FDTD method is described for the general case. The excitation of a field problem by a field pattern and the transition from the field solution to a circuit representation by SPs is discussed.

    Findings – SPs obtained by FDTD with SIBC are validated with semi‐analytic solutions and compared with results obtained by different numerical methods. Results of a microstrip with a discontinuity considering losses are presented demonstrating the capability of the present method.

    Originality/value – The comparison of numerical results obtained by different methods demonstrates the capability of the present method to extract SPs from PCBs very efficiently.