Hybridization of volumetric and surface models for the computation of the T/R EC probe response due to a thin opening flaw

• Léa Maurice ^[2] ; Denis Prémel ^[2] ; József Pávó ^[1] ; Dominique Lesselier ^[3] ; Alain Nicolas ^[4]
  1. [1] Budapest University of Technology and Economics

     Budapest University of Technology and Economics

     Hungría

     
  2. [2] CEA LIST Saclay
  3. [3] Department of Research in Electromagnetics
  4. [4] Centrale Lyon

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• Localización: Compel: International journal for computation and mathematics in electrical and electronic engineering, ISSN 0332-1649, Vol. 27, Nº 1, 2008, págs. 298-306
• Idioma: inglés
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• Resumen

  • Purpose – The purpose of this paper is to describe the development of simulation tools dedicated to eddy current non destructive testing (ECNDT) on planar structures implying planar defects. Two integral approaches using the Green dyadic formalism are considered.

    Design/methodology/approach – The surface integral model (SIM) is dedicated to ideal cracks, whereas the volume integral method is adapted to general volumetric defects.

    Findings – The authors observed that SIM provides satisfactory results, except in some critical transmitting/receiving (T/R) configurations. This led us to propose a hybrid method based on the combination of the two previous ones.

    Originality/value – This method enables to simulate ECNDT on planar structures implying defects with a small opening using T/R probes.