Shuen-Lin Jeng, V. Roshan Joseph, C.F. Jeff Wu
A special type of factor called an amplification factor is used in the failure amplification method (FAMe) to maximize the information in the experiment. A strategy for model building in FAMe is proposed using generalized linear models (GLM), and the best design settings for improving the process capability are identified through selected GLMs and loss functions. The proposed method is illustrated through two experiments for improving printed circuit boards.
© 2001-2024 Fundación Dialnet · Todos los derechos reservados