Point and Interval Estimation for a Simple Step-Stress Model with Type-II Censoring

• Autores: N. Balakrishnan, Debasis Kundu, Hon Keung Tony, Nandini Kannan
• Localización: Journal of quality technology: A quarterly journal of methods applications and related topics, ISSN 0022-4065, Vol. 39, Nº. 1, 2007, págs. 35-47
• Idioma: inglés
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• Resumen

  • Accelerated testing allows experimenters to increase stress levels to obtain information on the lifetimes of experimental units more quickly than under normal operating conditions. In step-stress tests, the stress levels can be increased at fixed times during the experiment. A simple step-stress model under Type-II censoring is discussed in which the maximum likelihood estimators of the parameters are derived assuming a cumulative exposure model with lifetimes being exponentially distributed. Confidence intervals for the parameters are also derived and their performance assessed through a Monte Carlo simulation.