Resumen de Influence of the discretization error on the reconstruction accuracy in electrical capacitance tomography
Daniel Watzenig, Gerald Steiner, Anton Fuchs, Hubert Zangl
Purpose – The investigation of the influence of the modeling error on the solution of the inverse problem given uncertain measured data in electrical capacitance tomography (ECT).
Design/methodology/approach – The solution of the nonlinear inverse problem in ECT and hence, the obtainable accuracy of the reconstruction result, highly depends on the numerical modeling of the forward map and on the required regularization. The inherent discretization error propagates through the forward map, the solution of the inverse problem, the subsequent calculation of process parameters and properties and may lead to a substantial estimation error. Within this work different finite element meshes are compared in terms of obtainable reconstruction accuracy. In order to characterize the reconstruction results, two error measures are introduced, a relative integral error and the relative error in material fraction. In addition, the influence of the measurement noise given different meshes is investigated from the statistical point of view using repeated measurements.
Findings – The modeling error, the degree of regularization, and measurement uncertainties are the determining and limiting factors for the obtainable reconstruction accuracy of electrical tomography systems. The impact of these key influence factors on the calculation of process properties given both synthetic as well as measured data is quantified. Practical implications – The obtained results show that especially for measured data, the variability in calculated parameters strongly depends on the efforts put on the forward modeling, i.e. on an appropriate finite element mesh size. Hence, an investigation of the modeling error is highly recommended when real‐world tomography problems have to be solved.
Originality/value – The results presented in this work clearly show how the modeling error as well as inherent measurement uncertainties influence the solution of the inverse problem and the posterior calculation of certain parameters like void fraction in process tomography.
