Fault prognostic of electronics based on optimal multi-order particle filter

• Autores: Yuanyuan Jiang, Youren Wang, Yi Wu, Quan Sun
• Localización: Microelectronics reliability, ISSN 0026-2714, Nº. 62, 2016, págs. 167-177
• Idioma: inglés
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• Resumen

  • Abstract The accurate fault prediction is of great importance in electronics high reliability applications for condition based maintenance. Traditional Particle filter (TPF) used for fault prognostic mainly uses the first-order state equation which represents the relationship between the current state and one-step-before state without considering the relation with multi-step-before states. This paper presents an optimal multi-order particle filter method to improve the prediction accuracy. The multiple τth-order state equation is established by training Least Squares Support Vector Regression (LSSVR) via electronics historical failure data, the τ value and LSSVR parameters are optimized through Genetic Algorithm (GA). The optimal τth-order state equation which can really reflect electronics degradation process is used in particle filter to predict the electronics status, remaining useful life (RUL) or other performances. An online update scheme is developed to adapt the optimal τth-order state transformation model to dynamic electronics. The performance of the proposed method is evaluated by using the testing data from CG36A transistor degradation and lithium-ion battery data. Results show that it surpasses classical prediction methods, such as LSSVR, TPF.