Resumen de The Annual James L. Waters Symposium at Pittcon (2000)
The topic of the eleventh Waters Symposium, held in March 2000, was X-ray diffraction of powders and thin films, and three of the papers are featured in this issue of the Journal. In the introductory paper, Ron Jenkins (International Centre for Diffraction Data) presents an overview of the development of powder diffraction instrumentation. This is followed by a description of the development of the rotating anode X-ray generator and of imaging plates by Jimpei Harada (Rigaku Corporation). Finally, in the third paper, Tom Ryan (Philips Analytical) discusses the special requirements for instrumentation suitable for diffraction of thin films such as those that are important in semiconductors, recording media, and other technologies.
