A Multitechnique Approach for Materials Characterization:: Using X-Ray Diffractometry, Visible Spectroscopy, and Atomic Absorption Analysis to Determine Thin Metal Film Thickness

• Autores: Alfred T. D'Agostino
• Localización: Journal of chemical education, ISSN 0021-9584, Vol. 71, Nº 10 (October), 1994, págs. 892-896
• Idioma: inglés
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• Resumen

  • Procedure using X-Ray diffractometry, visible spectroscopy, and atomic absorption analysis to determine thin metal film thickness.