Optimum specimen sizes and sample allocation for estimating Weibull shape parameters for two competing failure modes

• Kazuyuki Suzuki ^[1] ; Toshie Nakamoto ^[3] ; Yohtaro Matsuo ^[2]
  1. [1] University of Electro-Communications

     University of Electro-Communications

     Japón

     
  2. [2] Tokyo Institute of Technology

     Tokyo Institute of Technology

     Japón

     
  3. [3] Marking Platform Development Fuji Xexox Co.

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• Localización: Quality control and applied statistics, ISSN 0033-5207, Vol. 55, Nº. 5-6, 2010, págs. 567-570
• Idioma: inglés
• Texto completo no disponible (Saber más ...)