Evaluation of shelf life of processed cheese by implementing neural computing models

• Autores: Sumit Goyal, Gyanendra Kumar Goyal
• Localización: IJIMAI, ISSN-e 1989-1660, Vol. 1, Nº. 5, 2012, págs. 61-64
• Idioma: inglés
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• Resumen

  • For predicting the shelf life of processed cheese stored at 7-8º C, Elman single and multilayer models were developed and compared. The input variables used for developing the models were soluble nitrogen, pH; standard plate count, Yeast & mould count, and spore count, while output variable was sensory score. Mean Square Error, Root Mean Square Error, Coefficient of Determination and Nash - Sutcliffo Coefficient were applied in order to compare the prediction ability of the developed models. The Elman models got simulated very well and showed excellent agreement between the experimental data and the predicted values, suggesting that the Elman models can be used for predicting the shelf life of processed cheese.