High-power emission, narrow-beam scanning, and sub-wavelength imaging using conducting gratings and left-handed materials

• Autores: Z. Li, J. F. Zhang, T. J. Cui
• Localización: Microwave and optical technology letters, ISSN 0895-2477, Vol. 48, Nº. 11, 2006, págs. 2359-2365
• Idioma: inglés
• Texto completo no disponible (Saber más ...)
• Resumen

  • Many amazing properties of a novel electromagnetic (EM) structure, consisting a conducting grating backed with a left-handed material (LHM) slab, are studied. High-directivity, high-power emission and narrow-beam scanning can be easily realized when this structure acts as an antenna. Simultaneously, if it works as an imaging system, extremely high resolution can also be obtained with the unique EM behaviors of the LHM. Proper usage of surface waves on apertures opened in the conducting screen makes this structure possess such attractive capabilities. In order to investigate such phenomena, a more general EM model is first developed through the equivalence principle, and then the method of moments is implemented to obtain the interesting results. All these amazing properties are clearly observed through the numerical results.