Quality control and applied statistics

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  Año 1993, Vol. 38, Número 5

  • Statistical process control

    • Control charts in the present of data correlation

      Don Wardell, Herbert Moskowitz, Robert D. Plante

      págs. 481-484

      

    • A robustness study of x̅ charts with variable sampling intervals

      Ramid W. Amin, Richard W. Miller

      págs. 485-486

      

    • A process capability indicator

      Lai K. Chan, T. K. Mak

      págs. 487-488

      

    • A statistical process control approach for carpal tunnel syndrome risk evaluation

      Ming C. Liu, Jeffrey E. Fernandez, Paul J. Davis

      págs. 489-490

      

    • Off-line quality control in electronics assembly: identifying the critical problem

      Susan L. Albin, David J. Friedman

      págs. 491-492

      

    • Off-line quality control applied to food products

      Zulema Lopes Pereira, Elaine Aspinwall

      págs. 493-494

      

    • Determining the optimal target value for a process with upper and lower specifications

      B. L. Dodson

      págs. 495-496

      

    • An analysis of Taguchi's on-line quality-monitoring procedures for attributes

      Mohamad R. Nayebpour, William H. Woodall

      págs. 497-498

      

    • The use of statistical process control and design of experiments in product and process improvement

      Douglas C. Montgomery

      págs. 499-500

      

    • Process tampering: an analysis of ON/OFF deadband process controlling

      Howard Gitlow, Keebom Kang, Stuart Kellogg

      págs. 501-502

      

  • Sampling principles and plans

    • Power of testing proportions in small two-sample studies when sample sizes are equal

      Alan B. Davis

      págs. 503-503

      

    • Quality selection of a two-dimensional process level under single acceptance sampling by variables

      Olle Carlsson

      págs. 505-506

      

  • Quality management

    • Taking a multivariate approach to total quality management

      Jerry D. Westbrook

      págs. 507-508

      

    • Three very dificult steps to total quality

      Oren Harari

      págs. 509-510

      

    • Total quality management and physician's clinical decisions

      David Blumenthal

      págs. 511-512

      

    • Organizational culture and its relationship to TQM

      Jerry D. Westbrook

      págs. 513-515

      

    • Management by panacea: accounting for transience

      John Gill, Sue Whittle

      págs. 517-518

      

    • A systematic supplier selection procedure

      Azim Houshyar, David Lyth

      págs. 519-520

      

    • Strategies for technical problem solving

      Richard D. Shainin

      págs. 521-523

      

    • Managerial self-efficacy and managerial performance

      Ivan T. Robertson

      págs. 525-527

      

    • The hidden professionals: product designers and their impact on design quality

      Mitchell Fleischer, Jeffrey K. Liker

      págs. 529-530

      

  • Mathematical statistics

    • Multivariate batch means and control variates

      Wei-Ning Yang, Barry L. Nelson

      págs. 531-533

      

  • Experimentation and correlation

    • Bayesian interval estimates which are also confidence intervals

      Thomas A. Severini

      págs. 535-537

      

    • Bayes and likelihood calculations from confidence intervals

      Bradley Efron

      págs. 539-541

      

    • The stalactite plot for the detection of multivariate outliers

      A. C. Atkinson, H. M. Mulira

      págs. 543-544

      

    • Design evaluation for reduction in performance variation of TV electron guns

      R. Ranganathan, Kalyan Kumar Chowdhury, Anurag Seksaria

      págs. 545-547

      

    • Contingency tables with missing data

      Michael J. Phillips

      págs. 549-550

      

    • An overview of Taguchi method and newly developed statistical methods for robust design

      Kwok-Leung Tsui

      págs. 551-552

      

    • A systematic approach to planning for a designed industrial experiment

      David E. Coleman, Douglas C. Montgomery

      págs. 553-554

      

    • Minimum detectable effects for 2k-p experimental plans

      Richard O. Lynch

      págs. 555-556