Quality control and applied statistics

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  Año 1993, Vol. 38, Número 1

  • Statistical process control

    • Some procedures for decision making in controlling high yield processes

      M. Xie, T.N. Goh

      págs. 19-20

      

    • Statistical process control in semiconductor manufacturing

      Costas J. Spanos

      págs. 21-22

      

    • On the effectiveness of the unit sample size for standard control charts: ARL vs. AURL

      Jeffrey M. Snow, John S. Usher, Bruce E. Stuckman

      págs. 23-25

      

    • CUSUM control charts under linear drift

      F. F. Gan

      págs. 27-27

      

    • Is the process capable? Tables and graphs in assesing C

      Smiley W. Cheng

      págs. 29-30

      

    • The inadvisability of using x̅ ± 2σ as statistical limits for the economic control quality

      David Druckman

      págs. 31-32

      

    • Standard bootstrap confidence interval estimates of Cpk

      F. A. LeRoy, Gary S. Wasserman

      págs. 33-34

      

    • An EWNA for monitoring a process standard deviation

      S. V. Crowder, M. D. Hamilton

      págs. 35-36

      

  • Sampling principles and plans

    • A central limit theorem for Latin hypercube sampling

      Art B. Owen

      págs. 37-38

      

    • On the performance of the nearest proportional to size sampling design

      Arun Kumar Adhikary

      págs. 39-40

      

    • Estimating the number of classes via sample coverage

      Anne Chao, Shen-Ming Lee

      págs. 41-42

      

    • Probability limits on outgoing quality for continuous sampling plans

      Lisa M. McShane, Bruce W. Turnbell

      págs. 43-43

      

    • Implementation on spreadsheets of control charts for attributes

      M.A.A. Cox

      págs. 45-45

      

    • Procedures and tables for the construction and selection of chain sampling plans ChSP-4A(c1, c2)r - Part 2

      C. Raju

      págs. 47-48

      

  • Quality management

    • Industrial experience with total quality management

      Alan Brown

      págs. 49-52

      

    • Allocating production into primary and secondary markets using quality considerations

      Ravindra Khattree

      págs. 53-54

      

    • What is total quality management for? A manager's perspective

      D. N. Lawson

      págs. 55-56

      

    • Transition from quality circles to total involvement in semiconductor manufacturing

      Carol A. Derry

      págs. 57-57

      

    • Research and training for quality improvement

      George E. P. Box

      págs. 59-60

      

    • SMR forum: the management of complexity

      Peter Child, Raimund Diederichs, Falk Hayo Sanders, Stefan Wisniowski

      págs. 61-64

      

    • Service, please: the Malcolm Baldrige National Quality Award

      David A. Collier

      págs. 65-66

      

    • A closer look at modular manufacturing and Deming management

      Bernard J. Schroer, M. Carl Ziemke

      págs. 67-68

      

    • Quality, profits and market value: a dynamic model

      Bryan A. Wenmoth

      págs. 69-70

      

    • A pictorial approach to poor-quality cost management

      Ye-Sho Chen, Kwei Tang

      págs. 71-71

      

    • A proposed approach to computer-supported TQM in maintenance work induction and accomplishment

      William A. Eldred

      págs. 73-73

      

  • Mathematical statistics

    • Sensitivity analysis of empirical studies

      Hans Nyquist

      págs. 75-76

      

    • Chaos, fractals and statistics

      Sangit Chatterjee, Mustafa R. Yilsnaz

      págs. 77-78

      

    • A probabilistic approach to optimal quality usage

      S. T. Rachev, B. Dimitrov, Z. Khalil

      págs. 79-81

      

  • Experimentation and correlation

    • Presenting experimental data effectively

      J. R. King

      págs. 83-83

      

    • Pairwise comparison consistency checking

      Eugenia M. Furems, L. S. Gnedenko

      págs. 85-86