The Mole, Amedeo Avogadro and Others
pág. 159
The Role of N~A in the Si: An Atomic Path to the Kilogram
pág. 167
Early History and Future Outlook for the X-ray Crystal Density Method
pág. 173
Determining the Avogadro Constant from Electrical Measurements
pág. 181
X-ray and Neutron Interferometry and the Measurement of Fundamental Constants
pág. 195
The Lattice Parameter of Silicon: A Survey
pág. 203
The Takagi Equations in Evaluating the Contributions of some Systematic Errors in Scanning LLL X-ray Interferometers
pág. 211
Density of Silicon Crystals
pág. 219
Fabrication and Sphericity Measurements of Single-crystal Silicon Spheres
pág. 231
Molar Mass Determinations for N~A (Avogadro) Projects: Present Status and Potential for the Future
pág. 245
The Influence of Temperature, Isotope Composition and Impurities on the Lattice Parameter of Si
pág. 251
The Growth of Highly Pure Silicon Crystals
pág. 255
Spectroscopic Measurements of Residual Impurities in Silicon and Application to the Measurement of Local Lattice Distortion
pág. 263
Scientific, Engineering and Metrological Problems in Producing Pure ^2^8Si and Growing Single Crystals
pág. 269
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