Quality control and applied statistics

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  Año 1992, Vol. 37, Número 5

  • Statistical process control

    • The role of quality engineering in the 1990s

      David R. Jones

      págs. 233-234

      

    • SPC in low-volum,e manufacturing: A case study

      George F. Koons, Jeffery J. Luner

      págs. 235-236

      

    • Control chart based on the Hodges-Lehmann estimator

      James A. Alloway, J.R., Mukund Raghavachari

      págs. 237-238

      

    • A cumulative score control scheme

      Hongjian Xiao

      págs. 239-240

      

    • Some omnibus exponentially weighted moving average statistical process monitoring schemes

      Rickie Domangue, Steven C. Patch

      págs. 241-242

      

  • Sampling principles and plans

    • Big is not necessarily beautiful in survey design: Measuremnt error and the APU science survey

      John F. Bell

      págs. 243-246

      

    • Probability limits on outgoing quality for continuous sampling plans

      Lisa M. McShane, B.W. Turnbull

      págs. 247-248

      

  • Quality management

    • American management must change its view of quality as a "necessary evil"

      Sangit Chatterjee, Mustafa Yilmaz

      págs. 249-250

      

    • A comparisonof quality attitudes in the USA and Japan: Empirical evidence

      Wolf D. Reitsperger, Shirley J. Daniel

      págs. 251-254

      

    • The effects of organizational context on quality management: An empirical investigation

      George Benson, Roger G Schroeder, Jayant V. Saraph

      págs. 255-257

      

    • Some recommendations for the implementation and functioning of quality circles

      H. Van de Water

      págs. 259-260

      

    • The quality dilemma

      págs. 261-262

      

    • Keeping the workforce competitive

      W. Wendell Fletcher, John A. Alic

      págs. 263-264

      

  • Mathematical statistics and probability theory

    • The clustering of mixed-mode data: A comparison of possible approaches

      B. S. Everitt, C. merette

      págs. 265-268

      

  • Experimentation and correlation

    • Taxonomy of elusive populations

      Leslie Kish

      págs. 269-272

      

    • Robustness of some designs against missing data

      R. Srivastava, V.K. Gupta, Aloke Dey

      págs. 273-274

      

    • Simultaneous testing of regression disturbances for heteroscedasticity and non-normality

      K. P. Kalirajan, S. K. W. Jayasuriya

      págs. 275-276

      

    • An empirical note concerning systematic measurement errors in regression analysis

      John H. Herbert, Khoan Dinh

      págs. 277-278

      

  • Applications

    • Organizing for a succesful CE process

      Bryan Siegal

      págs. 279-280

      

  • Analytical process control

    • Electron beam testing

      E. Wolfgang, S. Görlich, J. Kölzer

      págs. 281-282

      

  • Reliability

    • Bayes estimators or the avrage failure rates

      Kanwar Sen, Madhu Bala Jain

      págs. 283-285

      

    • Optoelectronics reliability

      Tetsuhiko Ikegami, Mitsuo Fukuda

      págs. 287-289