A Theoretical Approach to Matching Characteristics of a Novel Absorber Based on the Concept of Equivalent Transformation Method of Material Constant
Youji Kotsuka, Kazuo Shimodaira
págs. 2-8
Near-Field Magnetic Measurements and Their Application to EMC of Digital Equipment
Takashi Harada, Norio Masuda, Masahiro Yamaguchi
págs. 9-15
Investigation on 10 m Semi Anechoic Chamber by Using Grid-Ferrite and Open-Top Hollow Pyramidal EM Wave Absorber
Hiroshi Kurihara
págs. 16-23
Free Space Measurment Method with Parellel Electromagnetic Wave Beam by Using Dielectric Lenses and Horn Antennas for Reflectivity of Electromagnetic Absorbers in Millimeter Waves
Hirosuke Suzuki
págs. 24-29
Non-destructive Dielectric Measurement of Solid Lossy Dielectric Material Using Open-Ended Waveguide Infilled with Low-Loss Dielectric Material
Hidetoshi Ebara
págs. 30-37
Suppression Effect by Conducting Plate under Ground Plane for Emission from Printed Circuit Board
Teruo Tobana, Takayuki Sasamori, Kohshi Abe
págs. 38-43
Low Frequency Equivalent Circuit of Dual TEM Cell for Shielding Material Measurement
Atsuhiro Nishikata, Ryusuke Saito, Yukio Yamanaka
págs. 44-50
Analysis of Absorbing Characteristics of One-Layer EM-Absorber Using CIP Method
Shinya Watanabe, Youichi Kakuta, Osamu Hashimoto
págs. 51-60
Analysis of EM Environment for DSRC System on Express Highway with Wave Absorbers on Sidewalls and Pavement
Ramesh K. Pokharel, Osamu Hashimoto, Makoto Toyota
págs. 61-68
Realization of 3 m Semi Anechoic Chamber by Using Hybrid EM Wave Absorber Consisting of Composite Magnetic Material
págs. 69-71
Electromagnetic Shielding Evaluation Setup for Conductive O-Rings
Shinnichiro Yamamoto
págs. 72-76
A Study on the Effect of Grounded Conductive Sheet Placed over PCB for Electromagnetic Noise Shielding
Motoshi Tanaka, Hisashi Takita, Hiroshi Inoue
págs. 77-79
Radiation Impedance of a Thin Straight Antenna Derived from Hallen's Equation by the Circuit-Theoretical Method
Akira Yokoyama
págs. 80-87
10 GHz Low-Noise Low-Power Monolithic Integrated VCos in Digital CMOS Technology
Zheng Gu, Andreas Thiede
págs. 88-93
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